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The Florida Center for Analytical Electron
Microscopy is located at Florida International University (FIU), University
Park. It supports education and research in micro-analysis and imaging
of materials and is a National Science Foundation (NSF) funded center.
The Center uses two instruments, the Electron Probe MicroAnalyzer
(EPMA) JXA-8900-R and the JSM-5900-LV, low vacuum Scanning Electron
Microscope (SEM). Both instruments are fully automated and remotely
accessible. They are used in education, research and commercial applications.
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