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Instrumentation
SEM |
 SEM
is a versatile instrument that is capable of imaging a wide range
of materials -- from uncoated soft tissues to hard rocks in variable
pressure conditions. The SEM is utilized by a diverse user group -
from forensics, biomedical engineers, biologists, hard material scientists
to geologists and failure analysts.
JEOL JSM 5900LV
• High resolution of 3.0 nm
• Point and click PC interface
• Auto and manual focus
• Stage control
• Dual magnification
• Multipoint measurement
• Digital zoom
• Sample exchange
• Easily mouse operated
• Image capture
• Digital image capture – Polaroid camera available
• Large chamber and stage
• 5 axis automation
• Click-center-of-zoom
• Automatic low vacuum system
• Switch between LV and HV with one click
• Specimen can be held at LV without being subjected
to damaging effects of HV
• EDS-UTW detector
• CL detector
• SEI/BEI detectors
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